Transmission Electron Microscope (AQA A Level Physics)
Revision Note
Transmission Electron Microscope (TEM)
How does a TEM work?
In the 1930s, experimental scientists realised that the much shorter wavelengths that electron waves offered could be used to construct microscopes with a higher resolving power
The first to be constructed were transmission electron microscopes (TEMs)
Where light microscopes had used convex optical lenses, these microscopes focused beams of electrons using magnetic lenses
The electrons passed through a sample and formed an image on a fluorescent screen
A diagram showing the path of electrons through magnetic lenses
A cross-sectional diagram of a TEM. The dotted lines represent the paths of electrons - those travelling along the microscope's axis (the middle vertical line) are not deflected. Each magnetic lens has a different purpose.
The electron gun emits electrons through thermionic emission
These are then accelerated to high speeds (and therefore short wavelengths) by a large potential difference
The function of the condenser lens:
The condenser lens' magnetic field deflects the electrons into a wide beam travelling parallel to the axis of the microscope
This parallel beam is uniformly incident on the sample
The function of the objective lens:
This lens forms an image of the sample
It deflects the outer electrons in the beam towards the central axis, much like a convex optical lens does for light
Electrons travelling along the microscope's axis are not deflected, again similarly to light in a convex lens
The function of the projector lens:
This lens causes the beams from the objective lens to spread out, magnifying the image created by the objective lens
This magnified image is directed onto a fluorescent screen, emitting light where electrons are incident
Drawbacks of the TEM
The level of detail available in an image depends on the resolving power
In an electron microscope, electrons need to be travelling as fast as possible to have the shortest wavelength and therefore highest resolving power
In the TEM the electrons must pass through the sample
This reduces the speed of electrons, increasing wavelength and reducing resolving power so electron waves are unable to resolve as much detail as their short wavelength would allow
Additionally, not all electrons emitted by thermionic emission have the same speed, and not all electrons are slowed by the sample to the same degree
This means electrons in the beam have a range of speeds
Electrons travelling at different velocities through a magnetic field are deflected by different amounts
This means electrons passing through a single point in the sample are projected onto a range of locations on the fluorescent screen instead, forming a blurrier image
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